Noise. Methods of measurement of sound insulation by operators shelters or remote control cabins in industrial buildings 
             
            
           | 
          
            
            
            
              Basic norms of interchangeability. Geometrical product specifications. System for tolerances on linear sizes. Series of tolerances, limit deviations for holes and shafts 
             
            
           | 
          
            
            
            
              Basic norms of interchangeability. Deviations of form and position. General requirements for methods of measurements 
             
            
           | 
        
        
          
            
            
            
              Standard linear dimensions 
             
            
           | 
          
            
            
            
              State system for ensuring the uniformity of measurements. Reference conditions for linear and angular measurements 
             
            
           | 
          
            
            
            
              State system for ensuring the uniformity measurements. Permissible errors of measurement of linear dimensions to 500 mm 
             
            
           | 
        
        
          
            
            
            
              State system for ensuring the uniformity of measurement. Coating thickness measurement. Terms and definitions 
             
            
           | 
          
            
            
            
              The state system of ensuring the uniformity of measurements. Permissible errors of measurement of linear dimensions to 500 mm with non-specified tolerances 
             
            
           | 
          
            
            
            
              State system for ensuring the uniformity of measurements. Nanometre range relief measure with trapezoidal profile of elements. Verification method 
             
            
           | 
        
        
          
            
            
            
              State system for ensuring the uniformity of measurements. Single-crystal silicon nanometre range relief measures. Geometrical shapes, linear size and manufacturing material requirements 
             
            
           | 
          
            
            
            
              State system for ensuring the uniformity of measurements. Atomic-force scanning probe microscopes. Method for verification 
             
            
           | 
          
            
            
            
              State system for ensuring the uniformity of measurements. Scanning electron microscopes. Method for verification 
             
            
           |