Flat-parallel glass. Sets
|
Telescope system for optical devices. Visual method of resolution limits determination
|
Flat glass plates for interference measurements ПИ60, ПИ80, ПИ100, ПИ120
|
Product-quality index system. Mass-spectrometric analysers. Index nomenclature
|
Product-quality index system. Light microscopes. Nomenclature of indices
|
Product-quality index system. Phetometric instruments. Nomenclature of indices
|
Calibration of meters for artificial mechanical impurities
|
Calibration of meters by natural mechanical impurities
|
Radiation measuring transducers for light measurements. Relative spectral sensitivity characteristic. Requirements and classification.
|
Densitometer for measuring the reflection density. Photometric parameters.
|
Densitometer for measuring the transmission density. Photometric parameters.
|
Optical glass. Double refraction wave aberration. Measuring techniques.
|
